| 言語種別 | 英語 |
|---|---|
| 発行・発表の年月 | 2016/03 |
| 形態種別 | 国際会議論文 |
| 標題 | Measurement of Prospective Transient Recovery Voltage for Breaker Terminal Fault using Low Voltage SiC Diode |
| 執筆形態 | 共著 |
| 掲載誌名 | IEEJ-IEEEThailand Symposium |
| 掲載区分 | 国外 |
| 著者・共著者 | Yuki Sawada, Tadashi Koshizuka, Eiichi Haginomori, Hisatoshi Ikeda |
| 概要 | This paper shows the new method to decide the current zero for breaker terminal fault (BTF) interrupting condition at low voltage measurements using diode. It was found that the SiC diode is suitable to use the TRV measurement. The forward voltage drop of the SiC diode is nearly constant. The terminal voltage of the diode in BTF circuit during the current flowing is nearly constant regardless of the interrupting current. But, the terminal voltage after current interruption is varied with the amplitude of the current. The current zero is a border between the constant voltage region and varied region.
The amplitude of the measured TRV degrees with the diode resistance. The prospective TRV is able to convert from the measured TRV by the diode resistance at current zero. |